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  • 1
    ISSN: 0948-5023
    Keywords: Keywords: Molecular mechanics ; Intercalated clays ; Keggin cation.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Molecular mechanics simulation using Cerius2 modeling environment have been used to investigate the structure of montmorillonite, intercalated with Keggin-like cation7+. Present work is focused to the strategy of modelling in case of intercalated layered structures and to investigation of structure parameters characterizing the interlayer porosity, that means: the interlayer distance, the position, orientation and distribution of Keggin cations in the interlayer space and the stacking of layers. Molecular simulations revealed the structure of the interlayer and led to the following conclusions: In the most stable configuration the 3-fold axis of Keggin cation is perpendicular to the silicate layer. This orientation of Keggin cations leads to the basal spacing 19.51 (10-10 m). Energy minimization during the translation of Keggin cation along the silicate layer gives only small fluctuations of basal spacing and no correlation has been found between the shift of cation along the layers and the value of basal spacing. No systematic relationship has been found between the shift of cation and crystal energy and no systematic relationship exists between the mutual shift of two successive layers and the values of basal spacing and crystal energy. Consequently, no two-dimensional ordering of Keggin cations in the interlayer and no regular stacking of layers can be expected. X-ray diffraction diagrams obtained for montmorillonites, intercalated with Keggin cation, confirm present conclusions.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of molecular modeling 4 (1998), S. 176-182 
    ISSN: 0948-5023
    Keywords: Intercalation ; Montmorillonite ; Tetramethylammonium ; Trimethylphenylammonium
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The intercalation of organoammonium cations into smectite structure is the important step in the technology of non-linear optical materials. In this study we investigated the structure of montmorillonite (MMT), intercalated with two organoammonium cations : tetramethylammonium (TMA) and trimethylphenylammonium (TMPA) using molecular mechanics simulations. The studies were focused to following aspects: arrangement of organoammonium cations in the interlayer, their positions and orientation with respect to silicate layers and their anchoring to the layers. The calculated (basal) d-spacings for MMT with TMA 14.29 Å and 15.36 Å for MMT with TMPA are in good agreement with X-ray diffraction data.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 0948-5023
    Keywords: Keywords Vermiculite ; Intercalate ; Aniline ; Tetramethylammonium ; Molecular mechanics
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Molecular mechanics simulations in Cerius2 have been used for modelling vermiculite intercalated with tetramethylammonium and aniline cations. The published structure data obtained for these intercalated structures from X-ray single crystal diffraction have been used to test the force fields and modelling strategy for organo-clays. The strategy of modelling was based on the nonbond host-guest interactions and on rigid silicate layers and rigid guest species. The rigidity of silicate layers requires that the cell parameters a, b andγare kept fixed during the energy minimisation. The energy term was set up using the nonbond interaction terms only and the Crystal Packer module in Cerius2 has been used for the energy minimisation. In Crystal Packer the rigid units, i.e. the silicate layers and guest species can be translated and rotated during energy minimisation and the cell parameters c, α, and β have been varied. Three sets of Van derWaals (VDW) parameters available in Crystal Packer: Tripos, Universal and Dreiding have been used in present molecular simulations. Ab initio MP2 calculations were performed to justify the application of the force field. The best agreement of molecular mechanics simulations with both: experimental and ab initio data was obtained with the Tripos VDW parameters for both intercalates. The results of modelling are in good agreement with the experimental data as to the cell parameters and the interlayer packing. The cell parameters reported by Vahedi-Faridi and Guggenheim (1997) for tetramethylammonium-vermiculite are: c = 13.616 Å, α = 90°, β = 97.68° ; from the present modelling we obtained: c = 13.609 Å, α = 90.19°, β = 97.56°. Tetramethylammonium-cations are arranged in one layer in the interlayer space. One C-C edge of NC4 tetrahedra is perpendicular to the silicate layers. The deep immersion of the methyl groups into the ditrigonal cavities suggested by Vahedi-Faridi and Guggenheim was not confirmed by modelling. Slade and Stone (1984) presented the measured cell parameters for aniline vermiculite: c = 14.89 Å, α = 90°, β = 97°; present result is: c = 14.81 Å, α = 90.72°, β = 96.70° for partially exchanged vermiculite and c = 14.84 Å, α = 90.53°, β = 97.17° for fully exchanged vermiculite. The aniline cations are positioned over the ditrigonal cavities alternating in their anchoring to lower and upper silicate layer. The C-N bonds are perpendicular to layers.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 0948-5023
    Keywords: Intercalated clays ; Tetramethylammonium-clays ; Modeling ; Molecular mechanics ; Montmorillonite ; Beidellite
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Molecular mechanics simulations, combined with X-ray powder diffraction and infrared spectroscopy, have been used in structure analysis of montmorillonite and beidellite intercalated with tetramethylammonium cations. A complex structure analysis provided us with the detailed structure model, including characterization of the disorder, the total sublimation energy and a charge distribution in the structure of intercalates. The calculated basal spacings (14.36 Å for TMA-montmorillonite and 14.12 Å for TMA-beidellite) are in good agreement with the experimental values (14.31 Å for TMA-montmorillonite and 14.147 Å for TMA-beidellite). Both intercalated structures exhibit positional and orientational disorder in the arrangement of TMA cations, and consequently disorder in layer-stacking. In the present work we analyse the effect of octahedral and tetrahedral substitutions in a 2:1 silicate layer on the arrangement of tetramethylammonium (TMA) cations in the interlayer space of montmorillonite and beidellite. The most significant difference between TMA-montmorillonite and TMA-beidellite is in the charge distribution on the TMA cations and silicate layer. The TMA-beidellite structure is highly polarized, the total charge on one TMA cation is +0.167 e−, while the total charge on the TMA cation in montmorillonite is +0.050 e−.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Czechoslovak journal of physics 40 (1990), S. 237-240 
    ISSN: 1572-9486
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Czechoslovak journal of physics 42 (1992), S. 539-544 
    ISSN: 1572-9486
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Depth profile analysis of the Cu-Ni interdiffusion couple was made by GDOS. Calibration of both the signal intensity and the sputtering rate was used for quantification. The quantified GDOS depth profile was compared with the profile measured by Auger analysis of the bottoms of glow discharge erosion craters with different depths. A reasonable agreement was found between both profiles demonstrating the usefulness of GDOS for this kind of analysis.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Microchimica acta 107 (1992), S. 81-89 
    ISSN: 1436-5073
    Keywords: depth profiling ; glow discharge optical spectroscopy ; thickness determination ; piece-wise linear functions
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract A data processing method is presented making it possible to determine thin film thickness from GDOS depth profiles. It consists of fitting a piece-wise linear function to the depth profile and in using positions (abscissae) of their knots as parameters which are proportional to film thickness. For thickness calibration, such a linear combination of these parameters is used, which gives minimum variation coefficient of the residuals between the real and the estimated thickness of calibration samples. Relative error lower than 3% was obtained in calibration using 4 samples with nickel film thickness ranging from 0.1 to 8.3 μm, each analyzed four times.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 691-694 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Steel samples coated by electroless nickel were annealed in air. Oxide growth kinetics and iron diffusion through the structure were investigated by glow discharge optical emission spectroscopy (GDOS) depth profiling. Protection against high-temperature oxidation was found to be given mostly by the austenitic interdiffusion layer formed at the interface between the substrate and the Ni—P film during annealing of the sample, which acts as a diffusion barrier for diffusion of iron to the surface.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 775-780 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Depth profiles of nickel thin films on silicon obtained with a Grimm glow discharge lamp operating at various conditions were compared. The best conditions for the profile analysis are: high argon pressure, high discharge current and low discharge voltage. The signal response at the interface was described quantitatively using piecewise linear model functions. Influence of the discharge parameters on the signal response at the interface was discussed. Interface broadening was confirmed to be caused by the crater effect, with a non-uniform removal rate distribution across the analysed spot that does not depend on the total sputtered depth in the analysis of a homogeneous sample.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 791-793 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Concentration-depth profiles which are distorted by the crater effect exhibit a special relationship between the concentration vs. depth distribution and the measured signal vs. time response. This relation is given by a linear Volterra integral equation of the first kind with the kernel which can be experimentally evaluated. A numerical procedure is described for the profile correction by solving that equation, along with discussion of existence, uniqueness of the solution and convergence of the approximations to the original profile.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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