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  • Scanning transmission electron microscopy  (3)
  • Diffraction geometry  (1)
  • 1
    Electronic Resource
    Electronic Resource
    A simplified mode of differential phase contrast lorentz microscopy (1993)
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 25 (1993), S. 341-345 
    Details
    ISSN: 1059-910X
    Keywords: Magnetic domains ; Thin films ; Iron ; Cobalt ; Scanning transmission electron microscopy ; Annular detector ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A simplified mode of differential phase contrast Lorentz microscopy for the study of magnetic domain structures in thin films is proposed and demonstrated. This mode employs a single annular detector in a scanning transmission electron microscope rather than the specialized split detectors that have been previously used. The resulting signal is sufficiently linear with magnetic field strength to allow quantitative data to be obtained on the domain configurations and the natures of the domain walls. © 1993 Wiley-Liss, Inc.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1070250411
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    STEM imaging of thick specimens with off-axis detectors (1984)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 1 (1984), S. 83-94 
    Details
    ISSN: 0741-0581
    Keywords: Scanning transmission electron microscopy ; Image contrast ; Inelastic scattering ; Thick specimens ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: For scanning transmission electron microscopy (STEM) images obtained with relatively small objective aperture sizes, the contrast of small objects contained within thick specimens may be considerably enhanced by using an off-axis detector aperture situated on the edge of the central beam spot. The effect is demonstrated for both crystalline and amorphous specimens. The effect arises because the detector collects part of the small angle inelastic scattering and is modified by refraction effects for specimens of rapidly changing thickness.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060010108
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Electron diffraction phenomena observed with a high resolution STEM instrument (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 25-44 
    Details
    ISSN: 0741-0581
    Keywords: Electron diffraction ; Scanning transmission electron microscopy ; Microdiffraction ; In-line holography ; Small particles ; Crystal structure ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Because of the high brightness of the cold field emission source used in a dedicated scanning transmission electron microscopy (STEM) instrument, it is possible to focus electrons to a cross-over of width 3Å or less and, with a suitable detection system, to obtain diffraction patterns from specimen regions of this size or greater. Coherent interference effects are visible in shadow images (in-line holograms) and in convergent beam diffraction patterns. Special techniques have been developed for gathering information from the diffraction patterns for application to the study of the structures of crystal defects, crystal surfaces and small particles. Possibilities have been explored for holographic reconstruction from shadow images.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060030105
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Geometric analysis of surface resonance conditions in reflection high energy electron diffraction (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 6 (1987), S. 43-53 
    Details
    ISSN: 0741-0581
    Keywords: Ewald sphere ; Refraction ; Specular reflection ; Double diffraction ; Diffraction geometry ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A three-dimensional analysis in reciprocal space is used to analyse reflection high energy electron diffraction (RHEED) patterns. Particular emphasis is placed on investigating the surface resonance phenomenon, the resonance conditions, and the diffraction mechanisms. The surface resonance regions defined by the resonance beam threshold conditions are related to the limits for the specular reflection spot in the diffraction pattern. The introduction of an Ewald sphere of varying radius is shown to be useful in understanding the surface phenomenon. Simulations based on the geometric theory, taking account of the surface refraction effect, describe very well the RHEED pattern geometry from the (111) surface of a platinum single crystal.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060060107
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    Paper (German National Licenses)
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