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  • 2000-2004  (2)
  • cracking  (1)
  • pulsed laser deposition  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    International journal of fracture 104 (2000), S. 169-179 
    ISSN: 1573-2673
    Keywords: Thin film ; delamination ; buckling ; cracking ; compliant substrate.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract It is shown that unless the substrate is at least as stiff as the film, the energy stored in the substrate contributes significantly to the energy release rate of film delamination under compression either with or without cracking. For very compliant substrates, such as polyethylene terephthalate (PET) with a indium tin oxide (ITO) film, the energy release rate allowing for the deformation of the substrate can be more than an order of magnitude greater than the value obtained neglecting the substrate's deformation. The argument that buckling delaminations tunnel at the tip rather than spread sideways because of increase in mode-mixity may need modification; it is still true for stiff substrates, but for compliant substrates the average energy release rate decreases with delamination width and the limitation in buckled width may be due to this stability as much as the increase in mode-mixity.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1572-9605
    Keywords: PrBa2Cu3O7−x ; thin film ; pulsed laser deposition ; surface morphology ; superconductivity
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We have grown PrBa2Cu3O7−x (PBCO) thin films on (100) SrTiO3 substrates using pulsed laser deposition (PLD). X-ray diffraction (XRD) studies indicate that the orientation of PBCO films varied with increasing deposition temperature: b axis oriented films can be grown at 680°C, and a axis oriented films at the temperature between 692°C and 705°C. Atomic force microscopy (AFM) reveals that a good flatness of the films was obtained with surface mean roughness of less than 24 Å, indicating that it is suitable for use as template layers in a axis oriented epitaxial YBa2Cu3O7−y /PBCO and YBCO/tetragonal–YBCO/PBCO multilayer structures.
    Type of Medium: Electronic Resource
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