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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Plasma chemistry and plasma processing 4 (1984), S. 235-249 
    ISSN: 1572-8986
    Keywords: Ionization cross section ; electron impact ; mass spectrometry
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Technology
    Notes: Abstract Electron impact ionization of carbon tetrachloride was studied as a function of electron energy from threshold up to 180 eV. A double-focusing mass spectrometer system in combination with an improved electron impact ion source was used, alleviating the problems of ion extraction from the source and the transmission of the extracted ions through the mass spectrometer system. Absolute partial ionization cross sections for the occurrence of CCl 3 + , CCl 2 + , CCl+, Cl 2 + , Cl+, C+, CCl 3 2+ , and CCl 2 2+ have been determined. In addition, the total ionization cross-section function of CCl4 is reported and compared with theoretical predictions based on a classical binary encounter approximation. Using nth root extrapolation the following ionization energies of the doubly ionized fragment ions have been derived: AE(CCl 3 2+ )=30.4±0.3 eV; and AE (CCl 2 2+ )=31.8±0.3 eV. In accordance with theoretical predictions and previous results, no stable CCl 4 + has been detected, however, metastable dissociation processes CCl 4 + → CCl 3 + have been observed.
    Type of Medium: Electronic Resource
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