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  • 36.40.+d  (2)
  • mass spectrometry  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Plasma chemistry and plasma processing 4 (1984), S. 235-249 
    ISSN: 1572-8986
    Keywords: Ionization cross section ; electron impact ; mass spectrometry
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Technology
    Notes: Abstract Electron impact ionization of carbon tetrachloride was studied as a function of electron energy from threshold up to 180 eV. A double-focusing mass spectrometer system in combination with an improved electron impact ion source was used, alleviating the problems of ion extraction from the source and the transmission of the extracted ions through the mass spectrometer system. Absolute partial ionization cross sections for the occurrence of CCl 3 + , CCl 2 + , CCl+, Cl 2 + , Cl+, C+, CCl 3 2+ , and CCl 2 2+ have been determined. In addition, the total ionization cross-section function of CCl4 is reported and compared with theoretical predictions based on a classical binary encounter approximation. Using nth root extrapolation the following ionization energies of the doubly ionized fragment ions have been derived: AE(CCl 3 2+ )=30.4±0.3 eV; and AE (CCl 2 2+ )=31.8±0.3 eV. In accordance with theoretical predictions and previous results, no stable CCl 4 + has been detected, however, metastable dissociation processes CCl 4 + → CCl 3 + have been observed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 24 (1992), S. 289-296 
    ISSN: 1434-6079
    Keywords: 36.40.+d ; 35.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Stoichiometric and non-stoichiometric negatively charged CO2 cluster ions have been produced in a crossed neutral cluster/electron beam ion source. The abundance and stability of these ions have been studied with a double focussing sector field mass spectrometer. The observed abundance anomalies (“magic numbers”) in the mass spectra of (CO2) n − and (CO2) n O− ions correlate with corresponding small and large metastable fractions of these ions (for loss of one CO2 unit). Variation of the measured metastable fractions as a function ofn are related to corresponding changes in the monomer binding energies. In addition, we have observed for the first time (CO2) n O 2 − ions (i.e. at electron energies above 8 eV with an energy resonance at about 14 eV) and we discuss possible production mechanisms for these ions. Relative electron attachment cross sections have been determined in the energy regime O〈E≦20 eV for (CO2) n − , (CO2) n O− and (CO2) n O 2 − withn=1 to 20. The shape of the cross section function for (CO2) n O− is strongly dependent on the cluster sizen.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 3 (1986), S. 319-322 
    ISSN: 1434-6079
    Keywords: 36.40.+d ; 34.80.Gs ; 35.20.Wg
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Multiply charged ammonia cluster ions are produced by adiabatic nozzle expansion and subsequent ionization by electron impact. They are analyzed in a double focussing sector field mass spectrometer (reversed geometry). Doubly charged clusters are only detected above a critical size of 51 and triply charged clusters above 121. Some of these multiply charged ions decay via metastable dissociation processes in the experimental time window accessible. Doubly charged ammonia clusters with sizes ofn≧51 lose one neutral monomer or, roughly ten times less probable, two neutral monomers. Conversely, triply charged ammonia clusters with sizes 110≦n≦120 show an extremely asymmetric Coulomb dissociation resulting in doubly charged cluster ions of about 90% of the initial mass
    Type of Medium: Electronic Resource
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