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  • 1
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 6322-6328 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Self-consistent tight-binding total energy calculations are performed to study the deposition of a few layers of cubic GaN on (100) β-SiC substrates. Cohesion energies, atomic displacements, dangling bond occupancies and surface reconstructions are calculated for a variety of epitaxial systems including monolayers of either Ga or N as well as single and double bilayers of GaN on either Si or C terminated substrates. The SiC substrates and Ga-N epitaxial layers are represented by 2×2 supercells of 9 Si and C monolayers plus the respective number of monolayers of Ga and N atoms. Depending on the system, surface atoms dimerize either symmetrically or asymmetrically resulting in either 2×1, c-2×2, or 2×2 surface reconstructions. At the substrate-epitaxial-layer interfaces, N binds stronger than Ga to either Si or C. Interface mixing is found to be energetically not advantageous for both C- and Si-terminated substrates, although for the latter the obtained small energy differences may suggest the possibility of mixing. © 1996 American Institute of Physics.
    Materialart: Digitale Medien
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  • 2
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4137-4140 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Hexagonal and cubic GaN layers are grown on (001) GaAs substrates by means of molecular beam epitaxy. First order Raman spectra are taken from these layers at various incident laser wavelengths and temperatures. The T2 transverse-optical (TO) and longitudinal-optical (LO) frequencies of cubic GaN are determined, as well as the A1 TO and LO, E1 TO, and E2 frequencies of hexagonal GaN. The T2 TO frequency of cubic GaN lies between the A1 and E1 TO frequencies of hexagonal GaN as one expects comparing the lattice dynamics of zincblende and wurtzite type crystals. The T2 TO frequency is close to the calculated value but disagrees with a recently reported experimental value. For the hexagonal layer, all frequencies are close to those previously measured. A broad Raman structure below the A1 LO peak is interpreted in terms of a disturbed long range order of the hexagonal layer. © 1996 American Institute of Physics.
    Materialart: Digitale Medien
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  • 3
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 3823-3828 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: ZnSe diodes grown on (100) GaAs substrates by molecular beam epitaxy were investigated using cathodoluminesence (CL) measurements at sample temperatures between 50 and 300 K. The CL line scans at different photon energies were performed on cleaved p–n junctions at 50 and 300 K, respectively. Taking into account surface recombination, carrier generation volume, carrier diffusion and internal built-in electric field and related carrier drift, the CL measurements from cleaved p–n junctions could be qualitatively explained. The charge depletion layer has a strong influence on the CL measurements. The calculated charge depletion width is in good agreement with CL measurements. The experimental data from the spatially resolved CL on the cleaved ZnSe diodes revealed important information of the carrier dynamics and recombination processes in these devices. © 2000 American Institute of Physics.
    Materialart: Digitale Medien
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  • 4
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 2631-2634 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The radio-frequency plasma-assisted molecular beam epitaxy of cubic AlyGa1−yN/GaN heterostructures on GaAs(001) substrates is reported. Rutherford backscattering spectroscopy, high resolution x-ray diffraction, and first-order micro-Raman spectroscopy measurements were used to characterize the structural and vibrational properties of the alloy epilayers. The Al content of the alloy is in the range from 0.07〈x〈0.20. X-ray diffraction reciprocal space maps demonstrate the good crystal quality of the cubic (Al, Ga)N/GaN films. The measured Raman shift of the TO phonon mode of the AlyGa1−yN alloy is in good agreement with theoretical calculations. © 2001 American Institute of Physics.
    Materialart: Digitale Medien
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  • 5
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1736-1743 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: X-ray diffraction in thin layers containing small randomly placed defects is described by means of the kinematical diffraction theory and optical coherence formalism. The method enables us to calculate both the diffracted intensity and its angular distribution, so that it can be used for simulating double crystal and triple crystal x-ray diffractometry experiments. The theory has been applied to experimental data obtained from diffractometry measurements of an epitaxial ZnTe layer with mosaic structure after several steps of chemical thinning. A good agreement of the theory with experiments has been achieved.
    Materialart: Digitale Medien
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  • 6
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 4061-4063 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Highly conducting p-type CdTe films were grown by photoassisted hot-wall-beam epitaxy using Li3N as a dopant source. Doping levels can be controlled from p=4×1016 to 2×1018 cm−3, as determined by Van der Pauw measurements. The hall mobility ranges from 30 to 100 cm2/V s, depending on the hole concentration. Photoassisted growth enhances the incorporation of dopants by one order of magnitude and decreases the growth rate.
    Materialart: Digitale Medien
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  • 7
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1220-1222 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The low-temperature near-band-edge photoluminescence of thick (d≈36 μm) (100)CdTe epilayers grown on (100)GaAs substrates is investigated. Besides a dominating bound exciton emission, evidence for free-exciton emission (n=1 and 2) and two electron transitions (TETs) of donor-bound excitons is found. The defect involved in the TET is most likely a gallium-related donor. This is concluded from the TET line wavelength adopting recent bulk CdTe TET data. A new emission line at 781.4 nm (1586.7 meV) is observed. It is tentatively assigned to a TET of a free exciton.
    Materialart: Digitale Medien
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  • 8
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1309-1311 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: X-ray rocking curves of (100) and (111) oriented CdTe epilayers grown by hot wall epitaxy on (100) GaAs substrates have been measured. Our results indicate that the number of extended defects increases with thickness in (111) CdTe epilayers but decreases with thickness in (100) CdTe epilayers. The distortion of the GaAs surface induced by the CdTe epilayer is determined from comparative measurements of the rocking curve of the covered and uncovered GaAs substrate.
    Materialart: Digitale Medien
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  • 9
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 700-702 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The influence of Yb added to the melt, on the near-band-gap emission of Ga1−xAlxAs grown by liquid phase epitaxy, is reported. No characteristic Yb3+ emission is found, but a pronounced narrowing of the bound-exciton spectrum is observed for Yb concentrations in the Ga melt below 100 ppm. A similar effect is seen in conduction band to acceptor transitions, for which the smallest linewidth observed is limited by fluctuations in composition and agrees well with the currently accepted 66:34 band-offset partition between the conduction and valence bands of GaAs/Ga1−xAlxAs heterojunctions in the direct band-gap range.
    Materialart: Digitale Medien
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  • 10
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 1243-1245 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: We have measured photoluminescence spectra of molecular-beam-epitaxy-grown cubic GaN/InxGa1−xN/GaN double heterostructures with x between 0.09 and 0.33. We observe a luminescence peak at about 2.3–2.4 eV which is almost independent of the InGaN layer composition. High-resolution x-ray diffraction measurements revealed a pseudomorphic In-rich phase with x=0.56±0.02 embedded in the InGaN layers. Including strain effects we calculate a gap energy Eg=2.13 eV of this phase. In cubic InGaN, spontaneous polarization and strain-induced piezoelectric fields are negligible. Therefore, the observed difference between the luminescence energy and the gap of the In-rich phase is assumed to be due to the localization of excitons at quantum-dot-like structures with a size of about 15 nm. © 2001 American Institute of Physics.
    Materialart: Digitale Medien
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