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Digitale Medien

Waveguide ultrasonic force microscopy at 60 MHz (2000)

Inagaki, K. ; Kolosov, O. V. ; Briggs, G. A. D. ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 76 (2000), S. 1836-1838

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: We present measurements using ultrasonic force microscopy at ∼60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson–Kendall–Roberts model of the force-distance curve. © 2000 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.126184

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Digitale Medien

Hysteresis of the cantilever shift in ultrasonic force microscopy (2002)

Inagaki, K. ; Matsuda, O. ; Wright, O. B.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 80 (2002), S. 2386-2388

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: We propose a technique based on ultrasonic force microscopy that exploits the hysteresis in cantilever jumping to and from a sample while varying the ultrasonic amplitude. Both the elastic modulus and the work of adhesion can be determined by comparision with a relation derived between their ratio and the cantilever shift at the jump-in point. The method is applied to measurements on an aluminum thin film. © 2002 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1463212

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