ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The energy response of a new semiconductor-detector array in the DIII–D tokamak for plasma x-ray diagnostics is characterized using synchrotron radiation at the Photon Factory (KEK) in Japan. This international cooperation research clarifies its good x-ray response ranging up to about 10 keV. The variations in detector-channel responses are also studied. Furthermore, new aluminum-coated x-ray semiconductor detectors are designed, fabricated, and characterized for the 10-keV-order DIII–D electron studies including the purpose of rf current-drive investigations; a flat response (the quantum efficiency η∼1) up to around 10-keV x rays, and a high efficiency (η≥0.3) even for the 20-keV x rays, are achieved. A wide variety of x-ray detection systems for the x-ray-energy range from a few tens eV to several hundreds keV in the GAMMA 10 tandem mirror is shown; that is, microchannel-plate tomography systems for the 0.01–60-keV x rays, a new ultra-low- energy-sensitive pure-Ge detector (0.2–50 keV), a Si(Li) detector (0.7–150 keV), a conventional pure-Ge detector (1.8–250 keV), and an NaI(Tl) detector (20–750 keV), silicon-surface-barrier detectors, and new semiconductor x-ray detectors for the purpose of the investigations of the effects of potentials on electron behavior in various tandem-mirror regions are represented. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1146345
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