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  • 11
    Electronic Resource
    Electronic Resource
    Effects of ion irradiation on silicon oxidation in electron cyclotron resonance argon and oxygen mixed plasma (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 1664-1669 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Effects of ion irradiation on oxidation of silicon at a temperature as low as 130 °C in an argon and oxygen mixed plasma excited by electron cyclotron resonance interaction have been investigated. The growth rate of the oxide films increases with increasing incident energy and flux of argon ions, and the thickness increases proportionally to the root square of the oxidation time, which suggests that the growth rate is limited by diffusion of oxidants enhanced by irradiation with argon ions. Effects of substrate bias on the oxidation characteristics have been also investigated. The growth rate increases with increasing positive bias, and the growth kinetics deviate from diffusion limited with increasing thickness. The bias dependence of the growth rate is caused by drift of negative oxidants enhanced by the electric field established in the oxide films. Moreover, it is shown that the electrical properties of the oxide films are improved by applying positive substrate bias. The improvement is due to a reduction of irradiation-damage in the initial oxidation stage. On the basis of the experimental results, it is concluded that the reduction of the incident energy and the flux of argon ions in the initial oxidation stage is essential to improve electrical properties of the oxide films. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373868
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  • 12
    Electronic Resource
    Electronic Resource
    Growth kinetics of CoSi formed by ion beam irradiation at room temperature (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 5480-5483 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Growth kinetics of cobalt silicide layers formed by ion beam irradiation was investigated at a temperature between room temperature and 100 °C. The CoSi phase was identified by x-ray diffraction of Co/Si samples irradiated with 25 keV argon ions to a dose of 2.0×1015 cm−2. The number of intermixed silicon atoms in the CoSi layers was evaluated as a function of dose, dose rate, and nuclear energy deposition rate at the Co/Si interface for samples irradiated with 40 keV focused silicon ion beams. The growth is shown to be diffusion-limited and attributed to radiation-enhanced diffusion with an activation energy of 0.16 eV. The number of intermixed silicon atoms is approximately proportional to the nuclear energy deposition rate at the initial Co/Si interface, while it is independent of dose rate, which shows that the CoSi phase is formed without contribution of the sample heating caused by irradiation. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.366460
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  • 13
    Electronic Resource
    Electronic Resource
    Deep level of iron-hydrogen complex in silicon (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 3828-3831 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Deep levels related to iron in n-type silicon have been investigated using thermally stimulated capacitance (TSCAP) combined with minority carrier injection. The TSCAP measurement reveals two traps of EV+0.31 and EV+0.41 eV. The trap of EV+0.41 eV is a donor due to interstitial iron. The trap of EV+0.31 eV, due to a complex of interstitial iron and hydrogen, is observed in the sample etched chemically with an acid mixture containing HF and HNO3 and annihilates after annealing at 175 °C for 30 min. It is demonstrated that interstitial 3d transition metals such as vanadium, chromium, and iron tend to form complexes with hydrogen in n-type silicon, and the complexes induce donor levels below the donor levels of the isolated interstitial species. This trend is related to the interaction between the metals and hydrogen in the complexes. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365746
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  • 14
    Electronic Resource
    Electronic Resource
    Deep states in silicon on sapphire by transient-current spectroscopy (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 5262-5264 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: It is demonstrated that deep states in silicon on sapphire (SOS) films can be evaluated by transient-current spectroscopy (TCS). In the TCS spectra, a broad peak extending over 100–200 K was observed for the 6000-Å-thick n-type SOS film. Assuming the value of capture cross section to be 10−15 cm2 and independent of temperature, the density distribution of deep states was estimated. The density distribution shows a peak of 1.2×1012 cm−2 eV−1 at EC−0.25 eV. Raman backscattering spectroscopy was also performed to evaluate the stress in the silicon film. It was concluded that the defects detected by TCS should be caused by the compressive stress of 6.2×108 Pa in the silicon film. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.366394
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  • 15
    Electronic Resource
    Electronic Resource
    Diffusion of vanadium in silicon (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 58 (1991), S. 1653-1655 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The diffusion profiles of vanadium in silicon have been investigated. In the temperature range 950–1200 °C an in-depth profile measurement by deep level transient spectroscopy was used, and in the temperature range 600–800 °C an annealing experiment which employed a technique for profiling the concentration of deep levels within a depletion region was used. From the two kinds of concentration-profile measurements, the diffusion coefficient of interstitial vanadium in silicon was determined, and it is represented by the expression DV= 9.0×10−3 exp(−1.55/kT) cm2 s−1.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.105154
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  • 16
    Electronic Resource
    Electronic Resource
    Longitudinal shrinkage of wood — Part II: The relation between Longitudinal shrinkage and structure (1967)
    Springer
    Wood science and technology 1 (1967), S. 81-98 
    Details
    ISSN: 1432-5225
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Zusammenfassung Die von Preston und Kelsey entworfenen Modelle zur Darstellung der Längsschwindung von Holz wurden von den Verfassern erweitert und zwar im Hinblick auf Scherspannungen zwischen Mikrofibrillen und zwischen Fasern. Es wurden mathematische Beziehungen aufgestellt und gezeigt, daß früher entwickelte Modelle dem hier entworfenen angenähert entsprechen. sprechen. Die Eignung des Modells wird von verschiedenen Gesichtspunkten aus beleuchtet und die Anderungen der Modellparameter bei wechselndem Feuchtigkeitsgehalt werden erörtert. Der Einfluß des Querschneidens der Fasern beim Mikrotomschnitt, der Einfluß der Delignifizierung und das Auftreten einer anomalen Hysterese werden besprochen. Die Parameter der entwickelten Modelle sind als Kurven dargestellt; diese werden unter Berücksichtigung der in der ersten Mitteilung veröffentlichten Ergebnisse erörtert. Als Schlußfolgerung ergibt sich, daß die Nichtlinearität, die in der Beziehung zwischen Längsschwindung und Feuchtigkeitsgehalt beobachtet wurde auf die Entwicklung eines gewissen Widerstandes gegen das gegenseitige Gleiten der Kettenmoleküle zurückkzuführen ist, und daß dieser Widerstand durch eine Zunahme der zwischen den Ketten bestehenden Molekularverbindungen bei abnehmendem Feuchtigkeitsgehalt verursacht wird. Ebenso wird vorgeschlagen, die irreversible Scherverformung zwischen den Fibrillen als Ursache für die Hysterese anzusehen.
    Notes: Summary Models put forward by Preston and Kelsey to represent the longitudinal shrinkage of wood have been extended to take into account shearing stresses between microfibrils and between fibres. Mathematical relationships have been developed and previous models shown to be approximations to that developed here. The suitability of the model from various points of view and the variations in the model parameters with changing moisture content are discussed. The effect of the cross-cutting of the fibres occurring in thin microtomed sections, the effect of delignification and the incidence of an anomalous hysteresis are also discussed. Curves are given for the parameters of the models developed and these are discussed in the light of the results reported in Part I of this paper. It is concluded that the non-linearity observed in the longitudinal shrinkage moisture content relationship is due to the development of restraint against slipping of the chain molecules along one another and that this restraint is caused by increasing inter-chain molecular bonding with decreasing moisture content. It is also suggested that the irreversible interfibrillar shearing strain is a cause of the hysteresis.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00353381
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  • 17
    Electronic Resource
    Electronic Resource
    Viscoelastic properties of wood in swelling systems (1981)
    Springer
    Wood science and technology 15 (1981), S. 57-66 
    Details
    ISSN: 1432-5225
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Summary The torsion modulus and the mechanical damping were investigated on wood swollen with formamide and a series of glycols, at frequencies of 0.5 and 0.02 Hz as a function of temperature. In wood swollen with formamide to the same extent as it would swell when saturated with water, the temperature of maximum damping was about 48° and above 100°C for wood swollen with polyethylene glycols, while that of water saturated wood was 80°C. For more highly formamide swollen wood (1.2 times the swelling in water) the temperature at which maximum damping develops decreased to 30°C. With regard to the influence of swelling and temperature on the torsion modulus of wood, three regions of viscoelastic behavior were recognized in these swelling systems. They are the glassy region in non-swollen wood, where the torsion modulus decreases gradually with increasing temperature, the transition region where the torsion modulus decreases abruptly with increasing temperature and swelling, and a plateau region appearing at high temperatures for highly swollen wood where the torsion modulus remains fairly constant with temperature with a value of about one tenth the modulus for non-swollen wood.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00366501
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  • 18
    Electronic Resource
    Electronic Resource
    Longitudinal shrinkage of wood — Part I: Longitudinal shrinkage of thin sections (1967)
    Springer
    Wood science and technology 1 (1967), S. 26-44 
    Details
    ISSN: 1432-5225
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Zusammenfassung Die Möglichkeit, Mikrotom-Längsschnitte zur Prüfung der Längsschwindung zu verwenden, wurde an Hoop Pine (Araucaria cunninghamii Ait.) geprüft. Dabei zeigte sich, daß die Längsschnitte beim Schneiden verschoben werden, was die nachfolgende Schwindung beeinflußt. Nachdem der Schnittwinkel des Mikrotommessers vergrößert worden war, konnten die Schnitte ohne Veränderung der Längsabmessungen abgetrennt werden. Das Längsschwindungs-Verhalten solcher Schnitte von über 80 μm Dicke unterschied sich nur wenig von demjenigen dickerer, gesägter Proben. Messungen der Längsschwindung mit Hilfe des beschriebenen Verfahrens zeigten, daß sehr dünne Schnitte (40 μm) eine größere Längsschwindung aufweisen als gesägte Schnitte. Die teilweise Delignifizierung mit Natrium Chlorit erhöhte ebenfalls die Längsschwindung. Die Längsschwindung blieb während aufeinanderfolgender zyklischer Feuchtigkeitsänderungen reproduzierbar, war aber nicht umkehrbar. Die Länge einer Probe war, bei gleichem Feuchtigkeitsgehalt während der Desorption geringer als während der Adsorption. Es darf als wahrscheinlich angesehen werden, daß die Längsschwindung des Holzes deutlich durch Spannungen beeinflußt wird, die sich beim Trocknen des Holzes innerhalb der Zellwand entwickeln.
    Notes: Summary The possibility of using microtomed longitudinal sections of wood for the study of longitudinal shrinkage has been investigated using hoop pine (Araucaria cunninghamii Ait.). Cutting of the sections was shown to distort them and to affect their subsequent shrinkage. However, by increasing the inclination angle of the microtome knife, sections could be cut without change in longitudinal dimensions. The longitudinal shrinkage behaviour of such sections more than 80 μm thick was little different from that of thicker sawn specimens. Measurements of longitudinal shrinkage using this technique showed that very thin sections (40 μm) had greater longitudinal shrinkage than sawn wood. Partial delignification with sodium chlorite also increased longitudinal shrinkage. The longitudinal shrinkage was reproducible over successive cycles of moisture content change but not reversible, the length of a specimen at a given moisture content being less during desorption than at the same moisture content during adsorption. It is considered likely that the longitudinal shrinkage of wood is markedly affected by stresses which develop within the cell wall as the wood dries.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00592254
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  • 19
    Electronic Resource
    Electronic Resource
    Surface properties of wood in physical and sensory aspects (1987)
    Springer
    Wood science and technology 21 (1987), S. 111-120 
    Details
    ISSN: 1432-5225
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Summary This paper deals with the relationships among the physical, anatomical and psychological properties of wood surfaces which play an important role in end-uses. Visual and tactile impressions of wood surfaces are partially governed by the surface profile, and were expressed in terms of roughness values. Sensory warmth of wood surfaces and thermal behavior at the hand/wood interface were measured when the surface was brought into contact with a hand. The warmth is highly correlated to the thermal conductivity of wood and to heat flow rate across the hand/wood interface. Resilience of balls with various rigidities impacting on wood surfaces was investigated in relation to hardness. It is suggested that hardness and resilience are governed by different mechanisms.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00376191
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