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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 4001-4005 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The antiferroelectric (AFE)-ferroelectric (FE) phase transformation under dc bias and hydrostatic pressure conditions in tin-modified lead zirconate titanate ceramics [Pb(Zr,Sn,Ti)O3, i.e., PZST] was investigated. The shifting of transformation temperature under these conditions and an electric field induced lattice softening are reported. Depending on the symmetry of external applied fields, the thermal stability region of one phase can be expanded at the expense of another. Experimental results indicate that a symmetric external field (such as hydrostatic pressure) tends to stabilize the AFE phase region, whereas an asymmetric external field (such as electric field) tends to extend the FE phase region. These observations are found to be generally consistent with many ferroelectric and antiferroelectric materials exhibiting a displacive structural phase transformation. Results are compared with the Clausius–Clapeyron relationship, and fundamental issues underlying the thermodynamic relationship and field-induced lattice softening behavior are discussed from the perspective of lattice dynamics theory. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1520-4995
    Source: ACS Legacy Archives
    Topics: Biology , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 267-274 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A three-component Fibonacci (3CF) Ta/Al multilayer has been reinvestigated by specular and diffuse x-ray reflectivity and x-ray photoelectron spectroscopy (XPS) after 41 months of storage at room temperature. The specular reflectivity shows drastically suppressed diffraction peaks, whose positions and intensities are explained by severe interdiffusion of the Ta/Al bilayers building the 3CF sequence. Nonspecular reflectivity scans still indicate a high degree of interfacial roughness correlation in the growth direction that is attributed to the long spatial Fourier components of the interface profiles, which are substantially less affected by interdiffusion. The angle-resolved XPS spectra show that the Ta capping layer is completely oxidized and interdiffused by Al, whereas below the oxide layer Ta and Al coexist in metallic form in the same film. Both x-ray reflectivity and XPS yield an oxide layer of ∼30 Å thickness. Despite the severe structural disintegration, the multilayer diffraction spectrum can still be indexed by means of the projection theory for quasiperiodic sequences, which points to a remarkable stability of quasiperiodic properties against significant disorder. We conclude that Ta/Al bilayers are apparently unsuitable for multilayer applications due to the lack of thermal stability even at room temperature, with grain boundary diffusion pointed out as a possible disintegration mechanism. The design of improved 3CF Ta/Al multilayers is discussed with regard to applications in x-ray optics. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 2499-2502 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An attractive-mode atomic force microscope is described in which the cantilever is held orthogonally with respect to the sample. The technique utilizes a linear differential optical detection scheme for the cantilever vibrations. In this design, the cantilever end is not bent to form a tip. This geometry substantially reduces the possibility of spontaneous jump-to-contact of the tip onto the sample, allowing the tip/sample separation to be set essentially to any desired value. Relatively large- and small-scale results are presented on imaging a smear of red blood cells, demonstrating the resolution and sensitivity.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 3406-3413 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The temperature dependence of phase stability for tin-modified lead zirconate titanate solid solution ceramics Pb(0.98)Nb0.02[(Zr1−x, Snx)1−yTiy]1−zO3 (PZST) was investigated by hot-stage transmission electron microscopy. Compositions studied included, a material that was antiferroelectric (AFE) at room temperature with x=0.42 and y=0.04, and a material that was ferroelectric (FE) at room temperature with x=0.43 and y=0.08 (abbreviated as PZST 42/4/2 and 43/8/2, respectively). PZST 42/4/2 was found to exhibit a sequence of phase transformations on heating of AFE–multicell cubic (MCC)–simple cubic (SC), whereas PZST 43/8/2 had a sequence of FE-AFE-MCC-SC. Previously referred to F spots (i.e., 1/2[111] superlattice spots) were observed in all four phases. The diffraction intensities for the F spots decreased with increasing temperature, and eventually disappeared above 300 °C. Electron diffraction confirmed the presence of the MCC phase which was characterized by the existence of weak 1/2[110] superlattice spots in the temperature region between the AFE and SC phases. In each composition the AFE phase was characterized by arrays of one-dimensional antiphase domain boundaries and (1/x)[110] superlattice spots. The modulation wavelength for the superlattice spots was found to be a strong function of temperature and was incommensurate with the lattice. The thermal stability of phases in the crystalline solution PZST system is discussed in terms of the observed microstructural features.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Energy & fuels 2 (1988), S. 26-31 
    ISSN: 1520-5029
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 7658-7663 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Transmission electron microscopy (TEM) was used to investigate the interfacial microstructure and the phases that developed during the nucleation and growth of oriented diamond on Ni by a hot filament process. Oriented Ni4C nuclei were identified by plan-view TEM in a sample quenched during the nucleation stage. Likewise, the presence of the Ni4C phase between the diamond and the Ni substrate was observed by cross-section TEM in samples grown for several hours. The orientational relationship among the diamond, Ni4C, and Ni substrate was examined by selected area diffraction. Diamond and Ni4C interfacial phase had a good epitaxial relationship, while the interfacial Ni4C phase and the Ni substrate developed with a small misfit and rotation. Based on these experimental results, the nucleation mechanism of oriented diamond growth on Ni is proposed. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 90 (1986), S. 2422-2424 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 2960-2962 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Real time in situ laser reflectometry was used to investigate changes in surface morphology observed during the nucleation of oriented diamond on Ni in a hot filament chemical vapor deposition reactor. Characteristic features observed in the intensities of reflected and scattered light were interpreted by comparison with scanning electron micrographs of the diamond seeded substrates quenched at sequential stages of the process. Based on this analysis, a process was developed in which the scattered light signal was used as a steering parameter. Using this process, oriented nucleation and growth of diamond on Ni can be repeatedly achieved. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 447-448 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present an absolute measurement of a two-photon absorption (TPA) coefficient of C60 thin film at 633 nm. Large values of β≈4.4 cm/W were determined. A nearly resonant TPA transition around the 3.76 eV absorption region was discussed.
    Type of Medium: Electronic Resource
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