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  • 1
    Digitale Medien
    Digitale Medien
    Absolute magnetometry at nanometer transverse spatial resolution: Holography of thin cobalt films in a scanning transmission electron microscope (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 7418-7424 
    Details
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: A method for the absolute measurement of magnetization at nanometer spatial resolution in magnetic thin films has been developed. A biprism placed in the illumination system of a scanning transmission electron microscope allows the operation of two distinct holography modes. The absolute mode displays a linear change in phase difference for regions of constant magnetization and thickness and the slope determines the magnitude of magnetization. The differential mode displays a constant value of phase difference in these regions allowing a simple and straightforward determination of domain wall profiles. Micromagnetic structure extracted from identical areas of thin Co films is compared using the new holography modes, differential phase constrast Lorentz microscopy and conventional Fresnel Lorentz microscopy in the same instrument.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1063/1.356658
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  • 2
    Digitale Medien
    Digitale Medien
    Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs-GaAs multiple-quantum-well structures (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 698-704 
    Details
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: By using a nanoprobe electron beam 4 A(ring) in diameter, the [001] nanodiffraction patterns of AlGaAs-GaAs multiple-quantum-well structures have been formed and the epitaxial relationship between AlGaAs and GaAs is confirmed. The intensities of the (200) diffraction disk, monitored by a spot detector, are displayed in two ways: (1) the (200) dark-field scanning transmission electron microscopy (STEM), which shows the layers of AlGaAs and GaAs in contrast, and (2) the (200) line-scan profile, which reveals the (200) intensity distribution of a specimen region of uniform thickness. The thickness and the absolute Al concentration of AlGaAs layers are, respectively, determined from the contrast of, and the (200) thickness contour position in, the (200) dark-field STEM images. The microanalysis on the (200) line-scan profile is used to find the local Al concentrations in AlGaAs layers and to study the interface boundary between the layers of AlGaAs and GaAs. Diffusion of the Al atoms from the AlGaAs layer into the GaAs layer is also reported.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1063/1.345774
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  • 3
    Digitale Medien
    Digitale Medien
    Comment on "Electron holographic study of ferroelectric domain walls'' (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 2446-2447 
    Details
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1063/1.109340
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  • 4
    Digitale Medien
    Digitale Medien
    Thickness dependence of ferroelectric domains in thin crystalline films (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 1906-1908 
    Details
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The thickness dependence of ferroelectric domains in thin free-standing BaTiO3 crystalline films has been studied by transmission electron microscopy. It is found that the widths of ferroelectric domains decrease as the film thickness decreases. This phenomenon may indicate that the ferroelectric properties of thin films are weakened due to surface relaxation effects, including lattice relaxation and a change of spontaneous polarization and charge compensation. The weakening of ferroelectric domains is suggested as a transition state from ferroelectric to paraelectric phase of the BaTiO3 thin film. The thickness of the surface relaxation layer of totally nonferroelectric film is on the order of 10 nm. © 1994 American Institue of Physics.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1063/1.112835
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  • 5
    Digitale Medien
    Digitale Medien
    High Resolution Electron Microscopy of Crystal Defects and Surfaces (1978)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Physical Chemistry 29 (1978), S. 251-283 
    Details
    ISSN: 0066-426X
    Quelle: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Thema: Chemie und Pharmazie , Physik
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1146/annurev.pc.29.100178.001343
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  • 6
    Digitale Medien
    Digitale Medien
    High-Resolution Electron Microscopy of Inorganic Materials (1976)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Materials Research 6 (1976), S. 53-81 
    Details
    ISSN: 0084-6600
    Quelle: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Thema: Maschinenbau
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1146/annurev.ms.06.080176.000413
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  • 7
    Digitale Medien
    Digitale Medien
    Diffraction by crystals with planar faults. I. General theory (1976)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 32 (1976), S. 83-87 
    Details
    ISSN: 1600-5724
    Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Thema: Chemie und Pharmazie , Geologie und Paläontologie , Physik
    Notizen: Kinematical diffraction from a crystal having planar faults is described by a systematic writing of the Patterson function and its Fourier transform for the general case of an arbitrary number of different kinds of layer, describing the faults in terms of a fault vector plus an addition, or subtraction, of scattering matter. The general series expression is readily simplified to deal with a wide variety of special cases. Particular examples include Wadsley-type shear faults associated with non-stoichiometry of oxides and the deformation and growth faults of simple close-packed structures.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1107/S0567739476000156
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  • 8
    Digitale Medien
    Digitale Medien
    Electron microscopy study of ordering of potassium ions in cubic KSbO3 (1978)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 34 (1978), S. 625-634 
    Details
    ISSN: 1600-5724
    Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Thema: Chemie und Pharmazie , Geologie und Paläontologie , Physik
    Notizen: Ordered and disordered states of potassium ions in (111) tunnels in the structure of cubic KSbO3 have been studied by high-resolution electron microscopy. N-beam calculations for the images of both the ordered and disordered states reproduce well the observed images. The disordered state changes into the ordered state under electron irradiation during the observations. Electron diffraction from the specimens and optical diffraction from the images show diffuse spots due to small domains of the long-range-ordered state, but no other diffuse scattering due to short-range order has been observed.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1107/S0567739478001291
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  • 9
    Digitale Medien
    Digitale Medien
    Diffraction by crystals with planar faults. III. Structure analyses using microtwins (1978)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 34 (1978), S. 738-743 
    Details
    ISSN: 1600-5724
    Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Thema: Chemie und Pharmazie , Geologie und Paläontologie , Physik
    Notizen: The general theory for kinematical diffraction from crystals having planar faults is applied to the case of microtwinning and the related cases occurring in some minerals where there is a disordered sequence of two types of structure having small differences in composition, unit-cell dimensions and axial orientations. It is shown that, if intensities are measured for unresolved or partially resolved pairs of diffraction spots using conventional techniques, errors may well arise if the measurements are interpreted on the usual assumption that the intensities from the different crystal regions are summed incoherently. Calculations for representative cases suggest that errors, due to the neglect of the spreading of intensity maxima into continuous streaks, may amount to 20 or 30% when overlapping diffraction spots have structure amplitudes of opposite sign, but are usually much smaller, especially if the structure amplitudes are of the same sign.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1107/S0567739478001515
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  • 10
    Digitale Medien
    Digitale Medien
    Short-range ordering in PbMg1/3Nb2/3O3 (1979)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 35 (1979), S. 1015-1017 
    Details
    ISSN: 1600-5724
    Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Thema: Chemie und Pharmazie , Geologie und Paläontologie , Physik
    Notizen: High-resolution electron-microscope images in conjunction with selected-area electron diffraction were used to investigate the short-range order in PbMg1/3Nb2/3O3. Intensity fluctuations of the [110] image indicated ordered domains extending over about 20 to 50 Å. Decomposition phases were observed.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1107/S0567739479002230
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