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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 95 (1991), S. 523-524 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 95 (1991), S. 2910-2918 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The energy dependence for electron trapping by H2O molecules condensed onto thin films of Kr and Xe has been measured between 0.4 and 11.0 eV. From these measurements, absolute cross sections for electron trapping were deduced and found to reach magnitudes in excess of 10−16 cm2 for incident kinetic energies smaller than 1.0 eV. This trapping is associated with electron capture by clusters of water molecules, a process related possibly to the solvation of the electron following the radiolysis of water. Near 0 eV, the cross section is so large that appreciable charging occurs when electrons of low residual energy are created at the onset of exciton formation in the Kr and Xe substrates. From 6.0 to 9.0 eV, further charge trapping proceeds via dissociative attachment, but a contribution from electrons scattered from electronic states of H2O cannot be excluded.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 94 (1991), S. 8570-8576 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Low energy (0–12 eV) electron impact on condensed amorphous H2O and D2O films is shown to induce electron stimulated desorption of H− and D−, respectively, via dissociative electron attachment. The onsets for H− and D− detection are at 5.5 eV, with a maximum yield for anion desorption at ∼7.4 eV. The kinetic energy distributions of the desorbing anions are peaked near 0 eV, indicating that the anions suffer post-dissociation collisions at or near the surface, with a large probability of anion trapping on the surface. The present results provide direct information on the dissociation products, prior to the interferences of subsequent reaction processes in the condensed film.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 90 (1989), S. 3402-3403 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We report the formation of the anion–atom complexes ArO− and ArCl− by electron stimulated desorption from multilayer argon films containing O2, N2O, and Cl2 molecules.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 88 (1988), S. 5166-5170 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The formation of O− ions via dissociative attachment (DA) in electron stimulated desorption from condensed CO is reported. The 2Π states of CO− previously observed in the gas phase and CO− states with the forbidden symmetry Σ− are involved below and above 13 eV, respectively, in the DA processes. Measurements of the kinetic energy of O− ions indicate that they suffer post dissociation interactions with the neighboring CO molecules before leaving the solid.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 93 (1990), S. 7476-7482 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Desorption of O− and OH− ions induced by low-energy (4–20 eV) electron impact on O2 and hydrocarbon molecules (CnH2n+2, n=5 and 8; CnH2n, n=2, 3, and 4) coadsorbed on Pt is reported. The magnitude of the O− and OH− signals is investigated as a function of incident electron energy and substrate coverage. Beyond monolayer coverage, results are provided for two types of coadsorption: a single hydrocarbon layer physisorbed on a multilayer O2 film and a multilayer film containing 25% volume O2 mixed with hydrocarbon molecules. For all experiments, the OH− yield function can be correlated with that of the O− signal from pure O2 and hydrocarbon–O2 mixture films. This result indicates that the OH− ions are produced by the abstraction reactions O−+CnH2n+2→OH−+CnH2n+1 and O−+CnH2n→OH−+CnH2n−1 where O− ions are generated by the dissociative attachment reaction e+O2 (3∑−g)→O−2 (2∏u,2∑+g,2∑+u)→O− (2P)+O(3P,1D). The observed reaction efficiency for OH− formation, defined as the ratio of the OH− intensity to that of O−, is found to increase with coverage of the substrate by C4H8–O2 and C5H12–O2 mixtures. It reaches values of 3% and 8%, respectively, above 3 monolayers for incident electrons of 13 eV. The energetics involved in those reactions as well as the behavior of the OH− intensity as a function of incident electron energy and coverage strongly suggest that OH− arises from dissociation of the intermediate quasi-bound anions CnH2n+2 O− and CnH2n O− into the limits OH−+CnH2n±1.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 91 (1989), S. 2664-2674 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Desorption of the ions O−, O−2,O−3 (and/or O2⋅O−) induced by electron impact on pure O2 multilayer films and Ar, Kr, and Xe matrix films containing O2 is reported. In addition to these anions, the ionic complexes M⋅O− (M=Ar and Kr) are also observed to desorb from Ar and Kr matrices, respectively. In the range 4–16 eV, the incident electron energy (Ei) dependence of the yields (i.e., the yield functions) of all the diatomic and triatomic anions exhibit features which can be correlated with the O− yield function; indicating that, these anions are produced by dissociative attachment reactions whose first step involves the formation of O−2 quasibound states. From analysis of all yield functions and variations of the anion yields as a function of O2 concentration in the matrices, we find that the simplest dissociative transient state, which can propel in vacuum an M⋅O− or O2⋅O− ion, must have the configuration M⋅O2⋅O−*2. To explain the formation of O−2 and O−3 ions below Ei(approximately-equal-to)6 eV, the existence of an electronically excited O−4 state decaying into the limits O−2+O2 and O−3+O must be postulated. At higher energies, O−2 can be formed by the reaction of O− (produced by dissociating O−2 states) with other O2 molecules (e.g., O−+O2→O−3→O−2+O). Both transient anion, M⋅O2O−*2,O−*4 result from initial electron capture by an O2 molecule in a dimeric configuration.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 5211-5220 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We discuss in detail the considerations necessary to determine the absolute stable anion formation (SAF) cross section for a molecule embedded within the bulk of condensed matter, using the low energy electron transmission (LEET) method. We show that the LEET method is applicable at any energy below the ionization potential of the charge trapping molecule and the first exciton energy of the matrix. As an example, charge trapping due to SAF from CF4 molecules is investigated. In order to generalize the LEET method, we solve in the Appendix a classical electrostatic boundary value problem using the method of images for a charge embedded in a dielectric medium surrounded by two other media of different dielectrics. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 2997-3003 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Possible causes of the spatial distortion encountered when using pierced resistive anodes for position-sensitive detection are discussed. An accurate map of the spatial distortion around a circular hole in a resistive anode is presented, which shows that the hole's effect is felt at distances up to three times its radius. The effect of load conditions on the detector's spatial linearity, as well as the distortions induced near the center of the detector due to penetrating electrostatic fields, are also discussed. In response to these points, alternative methods are described−in hardware and software−for the correction of distorted images. The hardware approach, which makes use of electrically programmable read-only memories, has the advantage of allowing real-time operation albeit with some loss in the precision of the intensities of the features within an image. One benefit of the software approach, beside the fact that it provides the best possible correction of the intensities, lies in the fact that all the information contained in the raw data is kept intact, which gives some latitude for future recalibration of the detector, or for emulation of a detector of another shape.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 3883-3889 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We investigate several problems inherent in the low energy electron transmission (LEET) technique for measuring cross sections σCT for charge trapping, by submonolayer (ML) quantities of a target molecule deposited onto the surface of a dielectric film. In particular we see that the energy of the incident electron beam while charging the film was poorly defined in the original method. Furthermore, we demonstrate that interactions between trapped charges and the metallic substrate set a limit of about 100 mV for the maximum surface potential that should be allowed in absolute measurements of CT cross sections. To surmount these problems, we show how the surface potential ΔV generated by electrons of specific incident energy can be obtained rapidly, by monitoring the relative transmitted current Ir at a single reference energy EREF, rather than by recording multiple LEET spectra (or injection curves). The approach allows several measurements at different incident electron energies to be made on a single film and increases markedly the rate of data acquisition. The overall uncertainty in these measurements has an upper limit of ∼50%. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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