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  • 1
    Electronic Resource
    Electronic Resource
    Coherent Foucault imaging: A method for imaging magnetic domain structures in thin films (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 5349-5355 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method for imaging magnetic domain structures in the transmission electron microscope is described. Coherent Foucault imaging provides a direct means of producing a magnetic interferogram which reveals the quantitative distribution of magnetic induction across the specimen. The technique requires the high coherence of a field-emission gun system and the ability to position an aperture accurately to cut part of the diffraction pattern. A simple analytical theory, together with computer simulations and experimental results, is presented to demonstrate the power of the technique.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357188
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  • 2
    Electronic Resource
    Electronic Resource
    Investigation of the magnetic structures in giant magnetoresistive multilayer films by electron microscopy : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6613-6615 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic structures which occur in (Co/Ni81Fe19/Co)/Cu multilayer films showing giant magnetoresistance have been investigated using electron microscopy. Rather similar fine domains, with sub-μm dimensions, were found in films comprising 14 and 6 magnetic layers. Whilst the observed structure depended greatly on the magnetic history of the sample, a combination of differential phase contrast imaging and low angle diffraction allowed an estimate to be made of the extent to which neighboring magnetic layers were aligned antiparallel to each other. For both samples typically two layers were found to have parallel alignment leading to the possibility that departures from the expected antiferromagnetic behavior are more prevalent at the surfaces rather than in the bulk of the multilayer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358210
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  • 3
    Electronic Resource
    Electronic Resource
    Magnetization reversal process in TbCo-biased spin valves : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6452-6454 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetization reversal processes in the free and the pinned layers of TbCo-biased spin valves have been studied in a highly modified transmission electron microscope. Reversal of the free layer in the presence of a field antiparallel to the biasing direction proceeds by a complex domain process with 360° walls forming frequently. In the presence of substantially higher fields, the pinned layer reverses by creep of highly irregular walls through the structure. By studying image grey levels, an estimate of the average orientation of the induction vector in the TbCo layer is made. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361971
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  • 4
    Electronic Resource
    Electronic Resource
    Electron beam fabrication and characterization of high-resolution magnetic force microscopy tips (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 2913-2919 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The stray field, magnetic microstructure, and switching behavior of high-resolution electron beam fabricated thin film tips for magnetic force microscopy (MFM) are investigated with different imaging modes in a transmission electron microscope (TEM). As the tiny smooth carbon needles covered with a thermally evaporated magnetic thin film are transparent to the electron energies used in these TEMs it is possible to observe both the external stray field emanating from the tips as well as their internal domain structure. The experiments confirm the basic features of electron beam fabricated thin film tips concluded from various MFM observations using these tips. Only a weak but highly concentrated stray field is observed emanating from the immediate apex region of the tip, consistent with their capability for high resolution. It also supports the negligible perturbation of the magnetization sample due to the tip stray field observed in MFM experiments. Investigation of the magnetization distributions within the tips, as well as preliminary magnetizing experiments, confirm a preferred single domain state of the high aspect ratio tips. To exclude artefacts of the observation techniques both nonmagnetic tips and those supporting different magnetization states are used for comparison. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361287
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  • 5
    Electronic Resource
    Electronic Resource
    Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 3002-3007 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic stray fields of Co-Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356166
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  • 6
    Electronic Resource
    Electronic Resource
    Magnetization reversal mechanisms in NiFe/Cu/NiFe/FeMn spin-valve structures (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 5554-5562 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Transmission electron microscopy is used to provide a detailed description of how magnetization reversals take place in NiFe/Cu/NiFe/FeMn spin-valves. Direct observation is made of how both NiFe layers respond to an applied field. Marked differences from the behavior observed in single Permalloy layers of the same thickness are identified. Complex 360° wall structures frequently form and are studied in some detail. A description of their structure is given and a theory involving the compensation of charges from the biased layer is suggested to explain stability. The work has a direct bearing on the performance of spin-valves as sensors as the way the magnetization changes under the influence of an applied field affects the noise characteristics. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359676
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  • 7
    Electronic Resource
    Electronic Resource
    Lorentz electron microscopy studies of magnetization reversal processes in epitaxial Fe(001) films : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6440-6442 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic domain structure and microscopic magnetization reversal processes in epitaxial Fe/GaAs(001) films with cubic anisotropy and in-plane easy axes have been investigated by a Lorentz microscope equipped with a magnetizing stage. For the films of a few hundred angstroms thickness we observe the single domain remanent state predicted for a two-dimensional film but find that domains play a crucial role in the magnetic reversal process. For reversal along the in-plane 〈110〉 directions (hard axes), magnetization reversal proceeds via a combination of coherent rotation and displacements of weakly pinned 90° domain walls at critical fields. For magnetization reversal along the in-plane 〈100〉 directions (easy axes), an irregular checkerboard domain structure develops at the critical field and both 180° and 90° domain walls coexist. The reversal of the domains with magnetization vector opposite to the applied field direction takes place by a combination of two 90° reorientations. We discuss how these processes are related to the magnetic anisotropies present in the film and the macroscopic M-H hysteresis curves.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358248
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  • 8
    Electronic Resource
    Electronic Resource
    X-ray microanalysis of InGaAs/InP multilayer structures grown by metalorganic chemical vapor deposition (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 2293-2299 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray microanalysis in a scanning transmission electron microscope can be employed to determine concentration profiles with a spatial resolution of (approximately-less-than)2 nm across layer interfaces in III-V compound semiconductor multilayer structures. Here we describe its application to the InGaAs/InP multilayer system grown by metalorganic chemical vapor deposition at atmospheric pressure. The results show that even when the material is structurally perfect, there can be a significant As and Ga content beyond the boundaries of the InGaAs layers. Furthermore, the composition profiles can show a marked asymmetry relating to the growth direction. The results are consistent with previous imaging observations but provide quantitative information with high spatial resolution on individual element distributions. This combination of analytical attributes is not available using any other assessment technique.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.342843
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  • 9
    Electronic Resource
    Electronic Resource
    The measurement of narrow domain-wall widths in SmCo5 using differential phase contrast electron microscopy (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 1338-1342 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Differential phase contrast imaging in a scanning transmission electron microscope has been used to measure very narrow domain walls in the ferromagnetic alloy SmCo5. This technique provides a more accurate and direct measurement of domain-wall structure than is possible with more conventional methods, and has allowed, for the first time, an experimental test of the predicted wall widths in highly anisotropic material.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.341856
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  • 10
    Electronic Resource
    Electronic Resource
    Transmission electron microscopy study of thermal effects on the free-layer reversal of a crossed-anisotropy spin valve (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4945-4947 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Transmission electron microscopy has been used to study the reversal of the free layer of a NiMn-pinned crossed-anisotropy spin valve as a function of applied field orientation and specimen temperature. By choosing the orientation of the applied field correctly it was possible to avoid the formation of domains in the reversal process. As the temperature was raised above room temperature, the mechanism remained qualitatively unchanged until temperatures of (approximate)200 °C were reached, beyond which irreversible behavioral change began to take place. From analysis of image sequences magnetoresistance characteristics have been constructed. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373210
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