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Diffraction of ultrashort XFEL pulses by perfect crystals (abstract) : Papers from the 12th National Synchrotron Radiation Instrumentation Conference (2002)

Shastri, S. D. ; Zambianchi, P. ; Mills, D. M.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 73 (2002), S. 1575-1575

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: Planned fourth generation sources, i.e., XFELs, motivate the study of dynamical diffraction effects in the interesting regime where pulse durations (femtoseconds) become comparable to or shorter than extinction lengths (microns). The transient, time-dependent diffracted intensities arising from incident delta-function impulses are calculated for Bragg and Laue geometries, examining both reflected and transmitted beams. Furthermore, the alteration of an XFEL pulse's spiky temporal structure as it passes through single- and double-crystal monochromators is discussed for both low- and high-order reflections. © 2002 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1448122

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Digitale Medien

Dynamical diffraction of ultrashort X-ray free-electron laser pulses (2001)

Shastri, S. D. ; Zambianchi, P. ; Mills, D. M.

Chester : International Union of Crystallography (IUCr)

Journal of synchrotron radiation 8 (2001), S. 1131-1135

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ISSN: 1600-5775

Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Thema: Geologie und Paläontologie , Physik

Notizen: Calculations are presented for the femtosecond time-evolution of intensities of beams diffracted by perfect Bragg crystals illuminated with radiation expected from X-ray free-electron lasers (XFELs) operating through the self-amplified spontaneous emission (SASE) process. After examining the case of transient diffraction of an electromagnetic delta-function impulse through flat, single- and double-crystal monochromators, the propagation of a 280 fs-duration SASE XFEL pulse of 8 keV photons through the same optics is discussed. The alteration of the sub-femtosecond spiky microbunched temporal structure of the XFEL pulse after it passes through the system is shown for both low-order (broad bandwidth) and high-order (narrow bandwidth) crystal reflections. Finally, the shot-to-shot statistical fluctuations of the integrated diffracted intensity is simulated. Implications of these results for XFEL applications are addressed.