ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Planned fourth generation sources, i.e., XFELs, motivate the study of dynamical diffraction effects in the interesting regime where pulse durations (femtoseconds) become comparable to or shorter than extinction lengths (microns). The transient, time-dependent diffracted intensities arising from incident delta-function impulses are calculated for Bragg and Laue geometries, examining both reflected and transmitted beams. Furthermore, the alteration of an XFEL pulse's spiky temporal structure as it passes through single- and double-crystal monochromators is discussed for both low- and high-order reflections. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1448122
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