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Digitale Medien

Generation and applications of computer drawn Kikuchi maps (1971)

Bomback, J. L. ; Thomas, L. E.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 4 (1971), S. 356-370

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Details

ISSN: 1600-5767

Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Thema: Geologie und Paläontologie , Physik

Notizen: Complete stereographic Kikuchi maps have been generated by computer plotting for b.c.c. (α-Fe), f.c.c. (Cu), h.c.p. (Mg), and diamond cubic (Si) lattices at 500 kV as well as for Si at 20 kV. The method offers considerable advantage over the usual laborious pasting together of individual diffraction patterns in order to map Kikuchi space. To facilitate the use of these maps in 100–1000 kV electron microscopy, indexed standard (001) stereographic triangles are presented for b.c.c. and f.c.c. along with the complete maps described above. The 20 kV silicon map is intended for use in scanning electron microscopy, where Kikuchi-like patterns called Coates patterns arise. Applications of the maps in transmission and scanning electron microscopy are described briefly.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1107/S0021889871007210

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Digitale Medien

X-ray fluorescence analysis of silver and palladium film thicknesses on silicon solar cells (1982)

Artz, B. E. ; Bomback, J. L.

New York, NY [u.a.] : Wiley-Blackwell

X-Ray Spectrometry 11 (1982), S. 51-54

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Details

ISSN: 0049-8246

Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy

Quelle: Wiley InterScience Backfile Collection 1832-2000

Thema: Physik

Notizen: An x-ray fluorescence technique was developed to analyze the thickness of Ag and Pd metallization layers on the back side contacts of Si solar cells. The technique employed a Sn secondary target x-ray source excited by a Cr target x-ray tube. Sn Kβ excited Ag Kα in the overlying Ag contact while Sn Kα and Kβ excited Pd Kα in the underlying Pd film. The emitted Ag and Pd Kα intensities were compared with corresponding intensities emitted from pure bulk Ag and Pd standards. Attenuation of Sn Kβ and Sn, Ag and Pd Kα in the Ag contact and in the standards was accounted for in the calculations. The results on 17 cells compared favorably with neutron activation analyses. An accuracy of ±10% was estimated for a 40 nm Pd film beneath a 7 μm Ag contact. Palladium films as thin as 1.5 nm were analyzed. The technique is nondestructive and can be applied to process control in a production environment as well as to laboratory testing of experimental cells.

Zusätzliches Material: 3 Ill.