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  • 1
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A beamline for macromolecular crystallography has been designed for the ALS. The source will be a 37-pole wiggler with a 2-T on-axis peak field. The wiggler will illuminate three beamlines, each accepting 3 mrad of horizontal aperture. The central beamline will primarily be used for multiple-wavelength anomalous dispersion measurements in the wavelength range from 4 to 0.9 A(ring). The beamline optics will comprise a double-crystal monochromator with a collimating premirror and a double-focusing mirror after the monochromator. The two side stations will be used for fixed-wavelength experiments within the wavelength range from 1.5 to 0.95 A(ring). The optics will consist of a conventional vertically focusing cylindrical mirror followed by an asymmetrically cut curved-crystal monochromator. This paper presents details of the optimization of the wiggler source for crystallography, gives a description of the beamline configuration, and discusses the reasons for the choices made. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3368-3368 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and operation of an imaging beamline at the Advanced Light Source used for providing diagnostic information on the electron beam for the accelerator and experimental groups is described. This system is based on a Kirkpatrick-Baez mirror pair and utilizes a carbon filter to give a bandpass in the soft x-ray region. The focused x-rays are viewed on a single-crystal scintillator through an optical microscope and the image recorded on a CCD camera. This system, together with other instruments to evaluate beam size, stability, and other time-dependent information, is described, data are presented, and the operation of the overall beamline is evaluated. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1480-1482 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Using a newly developed reflectometer we have measured the reflectivity at the silicon K edge for different silicon compounds. Combining these measurements with silicon L edge reflectivity measurements carried out on a different reflectometer we determined the binding energy of core excitons at the L edge. The results show that it is possible to carry out reflectivity measurements with the resolution necessary for the determination of the exciton parameters. Comparison with literature values shows that a rigid Kramers–Kronig analysis is not needed when the angle of incidence is well below the critical angle of total external reflection. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1313-1316 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and performance of the undulator beamline 5U.1 at the SRS used for soft x-ray spectroscopy is reported and compared with the theoretical expectation of the intensity, resolution, and polarization. The beamline consists of a ten-period permanent magnet variable gap undulator followed by an entrance slitless plane grating monochromator. The energy region covered is from 0.1 to 1 keV. The design is similar to the SX700 but uses a spherical instead of an ellipsoidal focusing mirror. To eliminate the large horizontal beam width at the exit slit the beamline has been modified to include a post-focusing mirror. The spherical focusing mirror has been changed to one with a larger radius resulting in a decreased demagnification, thereby essentially eliminating primary coma. The monochromator contains an ion-etched and lamellar profile 1200-lines/mm plane grating of Pt-coated CVD SiC on a graphite substrate. The high flux of the undulator makes the beam line suitable for SEXAFS studies and for work involving soft x-ray fluorescence detection. The combination of high flux and high resolution is especially advantageous for atomic and molecular spectroscopy and to resolve the quasiatomic structures which are observed in localized 3d transition metal compounds.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1482-1485 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report on an environmental chamber, which is attached to a UHV beamline, in which soft x-ray measurements can be done at atmospheric pressure in helium. X-ray measurements in air can only be performed at energies above about 3 keV because of the strong absorption of soft x rays by oxygen and nitrogen. However, a low-Z scatterer such as helium has a long absorption length for soft x rays even at atmospheric pressure. Thus, this new chamber allows soft x-ray experiments to be performed on samples with physical properties that are incompatible with UHV conditions, e.g., liquid and frozen aqueous solutions, corrosive materials, etc. A helium-tight tank has been installed behind the vacuum experimental chamber of the double crystal beamline 3.4 at the Daresbury SRS. The tank is purged with helium at atmospheric pressure and the gas in the tank is isolated from the high vacuum of the rest of the beamline by a thin mylar window which is supported on a capillary array. The tank contains a sample stage, two ionization chambers and a parallel-plate gas proportional counter for fluorescence detection of dilute samples, which has produced good results on the K edges of Cl, S, and P.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In this article we report the characteristics of the new High Energy Spherical Grating Monochromator beam line on the SRS. The instrument, which has no entrance slit, was designed to provide high photon flux with small spot size, in the energy range covering the 1s binding energies of carbon, nitrogen, oxygen, and fluorine. Radiation from a bending magnet is horizontally focused onto the exit slit by a long, Pt-coated meridian cylinder (R=299 m, 2 mrad horiz. aperture, 2° glancing angle). The light is vertically diffracted and focused by one of three interchangeable spherical gratings (1050, 1500, and 1800 lines mm−1) operating in negative order. Finally, the light is refocused by an ellipsoidal mirror. The photon flux, determined with copper and carbon photocathodes, is presented for the three gratings. Useful flux is obtained in the range 250–1200 eV, with intensity maxima for each grating at 600, 700, and 800 eV of 11, 9, and 5×1010 photons s−1 per 100-mA stored beam into a band pass of 0.05%. The influence of contaminants which are present on the optical elements is discussed, together with details of beam line operating conditions which minimize the build up of such contaminants. Photoabsorption and photoemission measurements indicate a high (up to 30%) second order and some third order light content. Resolution determinations obtained from photoabsorption measurements are presented. Although features as narrow as 250 meV have been resolved, the resolving power of the instrument is found to depend strongly on stored beam current. We suggest this may be due to electron beam (i.e., source) blow-up. We critically discuss the suitability of the new facility for surface EXAFS of low Z adsorbates, in particular above the carbon, nitrogen, and oxygen 1s edges, using examples from recent studies which have been undertaken on the beamline.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The availability of high brilliance third generation synchrotron sources together with progress in achromatic focusing optics allows us to add submicron spatial resolution to the conventional century-old x-ray diffraction technique. The new capabilities include the possibility to map in situ, grain orientations, crystalline phase distribution, and full strain/stress tensors at a very local level, by combining white and monochromatic x-ray microbeam diffraction. This is particularly relevant for high technology industry where the understanding of material properties at a microstructural level becomes increasingly important. After describing the latest advances in the submicron x-ray diffraction techniques at the Advanced Light Source, we will give some examples of its application in material science for the measurement of strain/stress in metallic thin films and interconnects. Its use in the field of environmental science will also be discussed. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 1608-1615 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The development of high-resolution, grazing-incidence soft x-ray monochromators is discussed, and the performance of competing designs is reviewed in terms of efficiency, ultimate resolution, and order sorting. In particular, the characteristics of astigmatically corrected spherical grating monochromator systems (SGM) is examined. A new design is presented in which a variable angle premirror is used to eliminate the wavelength dependent image distance of the SGM and allows the use of order sorting ranges. The properties of a competing design using a plane variable angle premirror, plane grating, and spherical mirror combination are presented, and similarities between this and the corrected SGM are discussed. Flux and resolution data are presented for an undulator monochromator of this latter design.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1599-1602 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design parameters for a unique third generation synchrotron radiation source (DAPS) optimized to provide peak brillance in the range 5–100 eV for high flux, high spectroscopic resolution, imaging and polarization studies in the VUV–SXR regions.
    Type of Medium: Electronic Resource
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  • 10
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A vertically dispersing high-energy spherical grating monochromator (HESGM) has been installed on the synchrotron radiation source (SRS) at the Daresbury Laboratory. The instrument has no entrance slit and provides a high intensity source of x rays of energy 250–1400 eV focused into a small spot suitable for surface spectroscopy. Photoabsorption features of 240 meV have been resolved, but the resolution of the instrument is dependent on the SRS stored beam current. The degree of linear polarization has been measured at the carbon K edge to be 0.80.
    Type of Medium: Electronic Resource
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