ZIB

Treffer pro Seite

Treffer 1 - 1 | 1 Treffer

Alles auswählen Exportieren

Digitale Medien

Particle Induced X-Ray Emission (PIXE) Analysis of Basella Alba L Leaves (2000)

Stihi, C. ; Popescu, I. V. ; Busuioc, G. ; [weitere]

Springer

Journal of radioanalytical and nuclear chemistry 246 (2000), S. 445-447

zur Merkliste hinzufügen auf der Merkliste

Details

ISSN: 1588-2780

Quelle: Springer Online Journal Archives 1860-2000

Thema: Chemie und Pharmazie , Energietechnik

Notizen: Abstract Six groups of Basella Alba L plants grown in different conditions were analysed by using particle induced X-ray emission (PIXE) method to establish a relationship between the elemental map and growth fertiliser conditions. The target samples were bombarded with a 3 MeV protons beam at the tandem accelerator of IFIN-HH Bucharest and the X-rays were detected with a HPGe detector with a 160 eV resolution at the 6.4 keV of Kα line of iron. The concentrations obtained have an estimated error of less then 6% for most of the elements analysed.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1023/A:1006796523789

Bibliothek	Standort	Signatur	Band/Heft/Jahr	Verfügbarkeit

Andere fanden auch interessant ...

Artikel (Nationallizenzen)

Volltext

Treffer 1 - 1 | 1 Treffer