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Dielectric response and structural properties of TiO2-doped Ba0.6Sr0.4TiO3 films (2002)

Jia, Q. X. ; Park, B. H. ; Gibbons, B. J. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 81 (2002), S. 114-116

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Dielectric Ba0.6Sr0.4TiO3 films doped with different weight percentages of TiO2 were deposited by pulsed-laser deposition. The dielectric constant, dielectric loss, and the dielectric tunability of the films were found to be a strong function of the weight ratio of TiO2/Ba0.6Sr0.4TiO3. Compared to the pure Ba0.6Sr0.4TiO3, the TiO2-doped Ba0.6Sr0.4TiO3 exhibits lower dielectric loss while maintaining a significantly adjustable dielectric constant and desirable capacitance tunability. The change of the dielectric properties of TiO2-doped Ba0.6Sr0.4TiO3 films is closely related to the change in microstructure of the films as revealed by transmission electron microscopy. © 2002 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1491287

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