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  • 1
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 26 (1986), S. 554-559 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Uniaxial tension tests to the yield point were performed on polyethylene as a function of temperature from 21 to 117°C at a strain rate of 2 min-1. At 21, 45, and 69°C, measurements were also made at strain rates from 0.02 to 8 min-1. Yield energy was found to be a linear function of temperature extrapolating to zero at the melting point (140°C). The ratio of thermal to mechanical energy to produce yielding is about three times smaller than for glassy amorphous polymers. The ratio of yield stress to (initial) Young's modulus is 0.021 at room temperature and increases to 0.059 at 117°C. Also this ratio was found to decrease with log strain rate. For instance, at 21°C for a strain rate of 0.02 min-1 the value was 0.023, while at 8 min-1 this value decreased to 0.020.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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