ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Starting from the Cottey conduction model and its extension, it is shown that the Fuchs-Sondheimer functions can be approximated by the extended Cottey function at any reduced thickness, provided that the specular electronic reflection coefficient,p, takes values larger than 0.31. Whatever the values ofp and the film thickness be an analytical formulation (in the form of the Cottey function) is proposed for an accurate approximation of the Fuchs-Sondheimer function. Moreover, it is suggested that the scattering processes defined in the Fuchs-Sondheimer model have no interaction.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00552414
