ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Experimental data related to the resistivity of chemically deposited silver films, and the TCR are interpreted from linearized equations in the framework of the three-dimensional conduction model. The electronic transmission coefficient at the grain boundary, t, and the electronic specular reflection coefficient at the film surface, p, are calculated from both resistivity and TCR measurements; no marked departure is observed. The high value of f agrees with crystallographic data.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00541847
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