ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract An effective-relaxation-time is used for representing the effects of electronic scattering in thin metallic films from sources other than grain boundaries; the total conductivity of the film is then expressed in terms of the product of an alternative Fuchs-Sondheimer function with an effective grain-boundary multidimensional function. The reduced Hall coefficient is then obtained in the form of the product of the reduced Fuchs-Sondheimer Hall coefficient with an effective reduced grain-boundary Hall coefficient. Qualitative agreement with experimental data is obtained.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01174068
Permalink