ISSN:
1432-0649
Keywords:
PACS: 42.65.An; 78.20.Ci; 78.40.Fy
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract. We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, and ZnTe semiconductors with 120-fs laser pulses. And the influence from the uncertainty of the focal plane (Z=0) position is discussed. It is also found that the TPA coefficient can be obtained independently without knowing the exact location of the focal point.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s003400050866
