Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
77 (2000), S. 594-596
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We report the observation of porous structures in laser-ablation-deposited Y2O3:Eu thin films and their correlation with luminescent properties by a combination of transmission electron microscopy and Z-contrast scanning transmission electron microscopy (Z-STEM). Depending on growth conditions, a large density of voids is incorporated into the films, which leads to a much increased surface area. Cathodoluminescence imaging in the STEM directly reveals a 5 nm "dead layer" around each void, which is responsible for the observed reduction in luminescence efficiency. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.127055
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