ZIB

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

Tip–sample distance feedback control in a scanning evanescent microwave microscope (1999)

Duewer, Fred ; Gao, C. ; Takeuchi, I. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 74 (1999), S. 2696-2698

add to mindlist on the mindlist

Details

ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We have developed a means of tip–sample distance regulation for a scanning evanescent microwave microscope over conductive samples. Changes in resonant frequency and quality factor are measured, where changes in resonant frequency are related to the tip–sample capacitance and changes in quality factor are related to microwave absorption. With the analytical expression of the tip–sample capacitance as a function of tip–sample distance, we can quantitatively regulate the tip–sample separation. We demonstrated simultaneous noncontact imaging of topography and surface resistance with high spatial resolution. © 1999 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.123940

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit