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Long-term reliability of Al-free InGaAsP/GaAs (λ=808 nm) lasers at high-power high-temperature operation (1997)

Diaz, J. ; Yi, H. J. ; Razeghi, M.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 71 (1997), S. 3042-3044

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We report the long-term reliability measurement on uncoated Al-free InGaAsP/GaAs (λ=808 nm) lasers at high-power and high-temperature operation. No degradation in laser performance has been observed for over 30 000 h of lifetime testing in any of randomly selected several 100-μm-wide uncoated lasers operated at 60 °C with 1 W continuous wave output power. This is the first and the most conclusive evidence ever reported that directly shows the high long-term reliability of uncoated Al-free lasers. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.119431

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