ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Thin films of Lanthanum titanate have been prepared on SiO2 coated Si and fused silica substrates by excimer ultraviolet laser ablation of potassium lanthanum titanate ceramics (K2La2Ti3O10). X-ray θ–2θ scans revealed that the films as-grown at a substrate temperature of 750–850 °C were single phase defective perovskite, and exhibited superstructure line in addition to the lines expected for the foundamenal perovskite structure. The films can be produced by escaping of potassium from K2La2Ti3O10 and the superstructure line observed was considered to arise from the ordered arrangement of the A-site vacancies. The chemical compositions of the films were determined by x-ray photoelectron spectroscopy (XPS). Optical waveguiding properties were demonstrated by m-line measurement using a rutile prism coupling method. The as grown films are colorless and transparent, and have the effective refractive index of 1.917 for TE modes at 632.8 nm. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.117368
