Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
59 (1991), S. 3039-3041
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Scanning tunneling microscopy (STM) images of YBa2Cu3Ox (YBCO) thin films show different growth mechanisms depending on the deposition method and substrate material. We present images of YBCO films sputter deposited onto MgO and SrTiO3, and laser ablated onto LaAlO3 showing screw dislocation and ledge growth mechanisms. At room temperature we observed an anomalous tunneling conductance near the edge of growth steps which causes a large apparent step-edge height in the STM image. This effect decreases with decreasing temperature, so that the step height approaches the expected value for one unit cell of 1.2 nm at 76 K. This phenomenon reflects changes in either the surface tunneling barrier or tunneling density of states upon cooling.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.105786
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