ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The effect of a Ti seed layer on the magnetic properties and microstructure of Co77Cr19Ta4 was studied in Co77Cr19Ta4/Ti/M (M=Co91Zr3Nb6, Fe, Co) double-layered perpendicular recording media. A thin Ti film of ∼5 nm enhanced the c-axis alignment perpendicular to the film plane, resulting in a large perpendicular anisotropy Ku and the best magnetic properties under the present experimental conditions. The coercivity at this Ti thickness (3–3.7 kOe) was approximately half of the magnetocrystalline anisotropy field Hk estimated from the Ku value, even with the present thick 50 nm CoCrTa. The recording performance using a single-pole-type writing head showed that media with a 5 nm Ti layer had higher recording sensitivity compared to media without Ti layers, and a higher SN value at densities greater than 200 kFRPI. No significant loss of recording resolution due to the nonmagnetic Ti space between the CoCrTa and the back layers was observed by the use of the 5 nm Ti film. Moreover, the results for media with Fe back layers indicated that a thinner back layer with a high flux density can be used without any reduction of recording sensitivity and resolution. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.372708
