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  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 114 (2001), S. 8831-8835 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: A pure SF6 free jet expansion has been used for the measurement of the autodetachment lifetime of the resonant excited anion SF6−* as a function of electron energy in the range 0–100 meV. In this low temperature environment, the lifetime was found to be 19.1±2.7 μs and independent of electron energy. This result is consistent with earlier statistical modeling of this process in terms of a coupling to the bath of SF6− states which is only a smoothly varying function across the energy range spanned by the electron affinity plus the small variation in electron kinetic energy. The temperature dependence of the autodetachment lifetime also suggests a strong coupling of vibrational motion in SF6 with the autodetachment process consistent with the picture of nuclear excited Feshbach resonances. In addition, the rate coefficient for the very inefficient secondary stabilization rate of the SF6−* states on collision with SF6 neutrals below 10 K is determined to be 3±1×10−12cm3 s−1. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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