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Characterization of a microfocused circularly polarized x-ray probe (2000)

Pollmann, J. ; Srajer, G. ; Maser, J. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 71 (2000), S. 2386-2390

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We report on the development of a circularly polarized x-ray microprobe in the intermediate energy range from 5 to 10 keV. In this experiment linearly polarized synchrotron radiation was circularly polarized by means of a Bragg-diffracting diamond phase retarder and subsequently focused down to a spot size of about 4×2 μm2 by a Fresnel zone plate. The properties of the microprobe were characterized, and the technique was applied to the two-dimensional mapping of magnetic domains in HoFe2. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1150625

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