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A noncontact cryogenic microwave measurement system for superconducting device characterization (1994)

Findikoglu, Alp T. ; Nakamura, T. ; Tokuda, H. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 65 (1994), S. 2912-2915

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: A noncontact cryogenic microwave measurement system has been developed for the characterization of passive and active superconducting devices by means of an unloaded quality factor measurement technique. The measurement system was designed specifically for the characterization of planar thin film resonant structures as a function of temperature (4–300 K), frequency (100 MHz–26.5 GHz), and dc voltage bias (≤100 V). It has been used for basic device studies of novel active superconducting lumped components made of metal-oxide superconductor/insulator heterostructures.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1144638

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