Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
18 (1989), S. 105-108
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Metallic shred obtained by turning bulk copper, brass and steel was embedded in resin and count rates were measured from these specimens and from the original bulk material. The specimens were then sliced into 0.5 mm thick sheets parallel to the plane of the x-ray beams and the distribution of the metal within each cut was mapped by an optical scanner. Fundamental parameter calculations were applied to compute the count rates from the shred specimens pixel by pixel according to the map and also the count rate ratios relative to the bulk material of the same composition. Whereas count rates between different measurement positions may vary by more than an order of magnitude owing to the statistical distribution of the metal grains, the computed values agree to within (typically) 10% (relative) with the experimental data from matching specimen areas.
Additional Material:
5 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300180306
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