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Positional small-angle X-ray scattering (1982)

Legrand, D. G. ; Tryson, G. R. ; Olszewski, W. V. ; [et al.]

Stamford, Conn. [u.a.] : Wiley-Blackwell

Polymer Engineering and Science 22 (1982), S. 928-933

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ISSN: 0032-3888

Keywords: Chemistry ; Chemical Engineering

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Positional small-angle X-ray scattering has been implemented and developed as a new nondestructive technique to study the formation and growth of flaws in polymers. The technique consists of measuring the intensity of scattering at a constant scattering angle while the sample is moved through the incident x-ray beam. Examples of applications of the technique from several different materials are presented.

Additional Material: 9 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/pen.760221504

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