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  • 1
    Electronic Resource
    Electronic Resource
    In-depth profiling of hydrogen in oxidic multilayer systems (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 16 (1990), S. 331-334 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The hydrogen concentration profiles of electrochromic multilayer systems produced by evaporation have been determined by means of nuclear reaction analysis. The H content of individual oxidic materials was found to be larger than for single films, especially for SiO2. The time-dependent H uptake under various ambient conditions was investigated. Systems produced by ion plating were also profiled for hydrogen.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740160170
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