ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Angle-dependent high-resolution XPS spectra of S 2p, In 3d5/2 and P 2p have been measured on the InP(001) sample etched chemically, treated with (NH4)2Sx at room temperature (RT), exposed to air at RT and annealed at 400°C in a vacuum. Three kinds (S-I, S-II and S-III) of chemical states of sulphur on the (NH4)2Sx-treated InP(001) surface at RT are found. It is suggested that S-I, S-II and S-III correspond to sulphur in the bulk, sulphur bridge-bonded to indium on the surface and elemental sulphur, respectively. Chemical state of S-III is decreased for the treated sample exposed to air at RT for 1 month. It is removed upon annealing the sample at 400°C in a vacuum, while S-I and S-II remain on the surface. The thickness of the sulphide layer on the annealed surface is estimated to be about one monolayer. Angle-dependent XPS spectra of S 2p and In 3d5/2 are discussed.
Additional Material:
4 Ill.
Type of Medium:
Electronic Resource
