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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 27 (1982), S. 2139-2150 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The residual stress in plasma polymerized films and its annealing effect were measured by employing the Newton ring method. The plasma polymerized films studied were hexamethyldisiloxane (HMDS), norbornadiene (NBD), and acryronitrile (AN) films. The stress in the film is compressive, and this compressive stress changes into tensile stress by annealing treatment. The ESR measurement indicates that the annealing effect on the stress is due to the trapped radical reaction. From the thermal stress measurement, the thermal expansion coefficient and Young's modulus have also been obtained; Young's modulus is in the order of magnitude of 108g/cm2 with HMDS and NBD films, and the thermal expansion coefficient is in the order of magnitude of 10-5 deg-1 with HMDS and NBD films. These values are much different from those of conventional polymer. This is attributed to the highly crosslinked structure of the films.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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