Electronic Resource
Springer
Hyperfine interactions
83 (1994), S. 321-325
ISSN:
1572-9540
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract The iron silicides are considered key materials for silicon integrated optoelectronic devices. This report describes the synthesis of the iron silicides starting with e-beam evaporated multilayered Fe/Si samples. Samples with two chemical wavelengths were studied upon annealing and ion beam mixing. The characterization included X-ray diffraction, CEMS and Rutherford backscattering.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF02074293
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