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Hot Electrons Effect in a #23 NTD Ge Sample (1998)

Soudée, J. ; Broszkiewicz, D. ; Giraud-Héraud, Y. ; [et al.]

Springer

Journal of low temperature physics 110 (1998), S. 1013-1027

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ISSN: 1573-7357

Source: Springer Online Journal Archives 1860-2000

Topics: Physics

Notes: Abstract We have measured thermal properties of Neutron Transmutation Doped Ge (type #23 from E. E. Haller) at very low temperatures (down to 20 mK). Both R versus T characteristics and thermal decoupling were considered. We show that, for our sample, the thermal decoupling can be well described with the hot electron model. Our results are consistent with those obtained for other doping concentrations NTD Ge. Finally, we compare the two decoupling mechanisms (electron-phonon and phonon-bath) and show that they are comparable in magnitude for standard running conditions of bolometers.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1023/A:1022360132094

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