ISSN:
1572-9605
Keywords:
Microwave response
;
surface impedance
;
complex conductivity
;
high-T c single crystals
;
phenomenological models
;
microscopic theory
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract A systematic description of recent measurements of the real R s and imaginary X s parts of the microwave surface impedance R s+ iX s in high-quality high-T c, superconducting single crystals, namely YBa2Cu3O6.95, Ba0.6K0.4BiO3, TI2Ba2CaCu2O8−δ, Tl2Ba2CuO6+δ, and Bi2Sr2CaCu2O8, is given. Electrodynamic principles of experimental techniques and uncontrollable factors that affect the accuracy of R s(T) and X s(T) measurements are analyzed. Common and distinctive features in the temperature dependences of the surface impedance and complex conductivity in various high-T c crystals are discussed. The experimental data are interpreted in terms of the two-fluid model taking into account scattering of quasiparticles and characteristic changes in the density of superconducting carriers as a function of temperature. The existing microscopic models of the microwave response of high-T c superconductors are considered and prospects for further research are outlined.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1022608613185
