ISSN:
1090-6487
Keywords:
78.20.Ls
;
78.20.Jq
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract The results of investigations of the transverse Kerr effect on an array of thin magnetic strips deposited on a silicon substrate are reported. The periodic structure of the sample gives rise to diffraction. It is observed that under certain experimental conditions the magnitude of the effect measured in diffracted beams is much greater than the maximum value for a sample with a uniform surface.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1134/1.567556