ISSN:
1618-2650
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Abstract Elastic recoil detection with heavy ions is a well suited method to measure depth profiles of light and medium heavy elements in thin films. Due to known Rutherford scattering cross sections and stopping powers of ions in matter, measurements can be quantified with an accuracy of about 1%. The transformation of energy spectra to quantitative elemental depth profiles, however, is generally a non trivial task and therefore a transofrmation algorithm has been developed based on a similar one for RBS analysis and realised in the program KONZERD. The transformation procedure allows a fast conversion from raw spectra to concentration profiles for classical ERD measurements as well as for high resolution measurements with a depth resolution better than 1 nm.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00321328
