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Generalized scattering factors and generalized Fourier transforms (1979)

Avery, J. ; Ørmen, P. J.

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 35 (1979), S. 849-851

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ISSN: 1600-5724

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Chemistry and Pharmacology , Geosciences , Physics

Notes: A method is proposed for evaluating generalized X-ray scattering factors (Fourier transforms of products of atomic orbitals) in the two-center case with Slater-type orbitals. This method is especially appropriate if one of the Slater exponents is considerably larger than the other.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0567739479001923

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