Electronic Resource
[S.l.]
:
International Union of Crystallography (IUCr)
Acta crystallographica
43 (1987), S. 212-216
ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
A new analytical method is presented for the separation of two or more closely overlapping X-ray diffraction lines using the narrowly distributed Gaussian function and one-dimensional fast Fourier transform pair. To test the method, the diffraction lines associated with characteristic Kα1 and Kα2 rays are measured by an X-ray diffractometer using a Brazilian quartz powder as a standard sample. It is found that the observed diffraction lines can be completely separated into Kα1 and Kα2 lines and that the accuracy of those diffraction angles is better than 2 × 10-4.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0108767387099549
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