Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
6 (1973), S. 463-465
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The results of an X-ray investigation of thin-structure parameters of textured hexagonal GaTe films by the fourth-moment method are given. A correlation between the thin structure and some of the physical properties of the films is shown.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889873009222
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