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  • 1
    Electronic Resource
    Electronic Resource
    A new X-ray diffraction-fluorescence method for the study of films: preliminary results for CuxS on CdS (1975)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 8 (1975), S. 333-334 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The structure of an ion-exchanged layer of CuxS on CdS has been studied by an X-ray method which yields diffraction and fluorescence results simultaneously. The method utilized a solid-state Ge crystal detector and a low incidence angle for the X-ray beam. From the fluorescence yield one can estimate the expected diffraction contribution of the surface film. The diffraction results indicated the presence of both chalcocite (Cu2S) and djurleite (Cu1.96S). A reversible phase transition near 100°C was observed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889875010552
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