Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
11 (1978), S. 137-140
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The resolution problem in X-ray energy-dispersive diffractometry is discussed. It is shown that for a given characteristic of the solid-state detector system and a given range of interplanar spacings, an optimum scattering angle can be easily found for any divergence of the incident and scattered beams.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S002188987801290X
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