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  • 1
    Electronic Resource
    Electronic Resource
    Reflection electron microscopy (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 147-160 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Reflection electron microscopy (REM) in ultra-high vacuum (UHV) conditions is reviewed. UHV-REM can characterize surface structures of monolayer levels such as steps, domains of reconstructed surface structures and their boundaries and these capabilities are used to observe surface dynamic processes such as phase transitions of reconstructed surface structures and adsorbate structures and adsorption processes, oxidations, sublimations and ion-sputtering and annealing. The method is compared with other surface-imaging techniques.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086916
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