Electronic Resource
Chester
:
International Union of Crystallography (IUCr)
Journal of synchrotron radiation
8 (2001), S. 163-167
ISSN:
1600-5775
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A new method is demonstrated for the quantification of Ti—O—Si and Ti—O—Ti bonds in Ti–Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti—O—Si reference material is most important for the successful application of this method. Three Ti–Si binary oxide systems have been analysed by the new method: Ti–Si mixed oxides, titania supported on silica and Ti-substituted MCM-41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0909049500020331
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